patent · US20040210874A1
Automatic test program generation method
21 October 2004
Indexed reference — no copy held
This patent is cited by material in the archive, so it is indexed here by number, title and inventor. The archive holds no copy of its text.
Provenance
- Collection
- Patents citing this work
- Patent office record
- patents.google.com →
- Source
- Google Patents citing-documents table
- Assignee
- Naohiro Kageyama
- Published
- 2004-10-21