patent · US7992348B2
High-frequency measuring enclosure for measuring large test objects
9 August 2011
Indexed reference — no copy held
This patent is cited by material in the archive, so it is indexed here by number, title and inventor. The archive holds no copy of its text.
Provenance
- Collection
- Patents citing this work
- Patent office record
- patents.google.com →
- Source
- Google Patents citing-documents table
- Assignee
- Astrium Gmbh
- Published
- 2011-08-09